NSC 216 - Characterization, Testing of Nanotechnology Structures and Materials

3 Credit Hours (Lab)

This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), 1 nm resolution field emission SEAM, UV-VIS spectrophotometer, and optical microscopes.

Prerequisite(s): NSC 211 NSC 212 NSC 213 NSC 214 NSC 215